research
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10/02/2018
An Automated System for Checking Lithography Friendliness of Standard Cells
At advanced process nodes, lithography weakpoints can exist in physical ...
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08/16/2018
Context-Aware DFM Rule Analysis and Scoring Using Machine Learning
To evaluate the quality of physical layout designs in terms of manufactu...
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08/16/2018
Creation and Fixing of Lithography Hotspots with Synopsys Tools
At advanced process nodes, pattern matching techniques have been used in...
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05/25/2018